|
The AutoSEM 1 is a fast, precise, image/x-ray analyzer designed specifically for the Scanning Electron Microscope (SEM). AutoSEM 1 makes use of a modern, graphical user interface (GUI). The GUI provides easy, intuitive access to all the program features.
By using an IBM compatible PC, AutoSEM 1 not only provides fast analysis previously obtainable only with larger, more expensive computers, but also allows access to the largest applications base in existence. All popular spread sheets, word processors, data bases, and other PC software can be run on the same computer as the image analysis. While no one application can meet everyone's needs, we do provide data files that meet the "PRN' standard and image files that meet the "TIFF" standard, allowing you the ability to import the data into your favorite spread sheet program and alter it as required. The AutoSEM 1 may be interfaced to virtually any SEM, thus making it an excellent upgrade path for new or older SEMs.
Using a signal such as Back Scattered Electrons (BSE) or Secondary Electrons (SE), the AutoSEM 1 starts searching at a resolution fine enough to find a feature, but coarse enough to allow rapid searching. When a feature is found, the resolution is increased to measure the feature to a precision specified by the user. Resolution can be as high as 16,000 lines. After the feature is measured, the resolution is decreased and the search continues. This type of dynamic resolution allows for fast searching and precise feature measurement.
|